Rapiscan Systems' patented Model 4100 Automatic Semiconductor Irradiation System is used to test military and aerospace electronic components at the wafer level of production, to determine if they meet specifications for survivability to total radiation exposure and transient-radiation/latch-up effects. The Model 4100 is the only instrument available that can perform these types of tests at the wafer level and in a general laboratory environment. Significant cost and throughput advantages are realized with the use of this instrument.

The Model 4100 has also shown promise as an economical test instrument for the accelerated evaluation of carrier hot-electron degradation in VLSI circuits. A Model 4100 is available for customer demonstrations and testing of integrated circuits.